Magnetic multilayers have become increasingly popular
as magnetic field sensors. The resistance of these structures depends directly
on the relative alignment of the magnetization between adjacent layers, which,
in turn, depends on the ambient magnetic field. Imaging the magnetic structure
of the buried layers in the multilayer is therefore valuable in understanding
how these devices work and how to optimize their performance. By combining
SEMPA with ion milling we were able to image the magnetic domain structure of
individual Co layers in a [Co(6nm)/Cu(6nm)]20 multilayer sensor
material. This work which involved a collaboration with
Michigan State University Center for Sensor Materials and the
NIST neutron condensed matter
science group resolved long standing questions regarding the size and
relative alignment of the magnetic domains in these multilayers.
Of particular interest is the as-prepared state of this
multilayer which has a large magnetoresistance value that is irreversibly lost
after applying a magnetic field. SEMPA images of the magnetic domain structure
and topography of the as-prepared top Co film are shown in Figures (a) and
(b), respectively. Figure (a) shows irregular magnetic domains with
feature sizes generally on the order of a micron, along with Néel-like
domain walls about 0.2 µm wide with random chirality. Figure (c)
shows a SEMPA image from the second Co layer after removing the top Co and Cu
layers. The domain structure of this layer is strongly anti-correlated with
that of the outermost layer in Figure (a). The anti-correlation even
extends to such small features as the domain walls, which preserve chirality in
the adjoining layer. The degree of correlation is quantified in a histogram
shown in Figure (d) of the difference in magnetization direction,
δ Φ,
between the two Co layers. The histogram shows that about 60% of the domains
are aligned antiparallel, while the rest are uncorrelated.
These images along with polarized neutron reflectivity measurements of the
average magnetization show that the high magnetoresistance of the as-prepared
multilayer is associated with a strong antiparallel magnetic alignment between
adjacent Co layers that cannot be recovered after magnetizing the multilayer.

SEMPA images of the topmost Co layer magnetization (a) and topography (b)
and second Co layer
magnetization (c) in the
[Co(6 nm)|Cu(6 nm)]20 sample. The magnetization direction
is mapped into
color as indicated by the colorwheel in the center. A histogram
of the difference in the magnetization
direction between the two layers,
δ Φ, is shown in (d).
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Observation of antiparallel magnetic order in weakly
coupled Co/Cu multilayers
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John Unguris
Robert J. Celotta
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Michael H. Kelley - NIST
David Tulchinsky - Naval Research Laboratory
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J.A. Borchers - NIST
J.A. Dura - NIST
C.F. Majkrzak - NIST
W.P. Pratt Jr. - Michigan State University
J. Bass - Michigan State University
Supported in part by the Office of Naval Research
Online: July 1999
Last Updated: February 2008
Website Comments:egpwebmaster@nist.gov