Nanomagnetics

Low dimensional magnetic systems, such as thin films, multilayers, and surfaces, as well as reduced dimensional systems, such as granular materials and microscopic lithographic devices exhibit many scientifically interesting and technologically useful properties. The physical and magnetic nanostructure of these materials is crucially important in determining their macroscopic magnetic properties. For example, the amount of information that can be stored on a hard disk depends critically on the magnetic interactions between the nanometer-sized grains from which the media is made. Our research seeks to develop new measurement methods to determine the role physical and magnetic nanostructure plays in determining macroscopic properties.

SEMPA
Magneto-Optic Microscopy
MFM

Magnetization Dynamics

• Magnetic properties of thin film edges
• Diagnostics of magnetic nanostructures
• Spin wave Doppler metrology

Patterned Structures

• Scaling
• Patterned Arrays
• Microscopic magnetic devices

Magnetic Imaging

• Spin Sensitive GaAs STM tips
• MFM/SEMPA comparison

Magneto-electronics and Spintronics

• Electron spin polarization determination from luminescence polarization
• Spin torque induced domain wall motion
• Sensors

Magnetic Materials

• Geomagnetism
• Domain wall motion
• Domains in granular GMR materials

Magnetic Storage

• Heads
• Patterned media
• Recording media

Magnetic Multilayers Films and Surfaces

• Stress-induced anisotropy
• Co/GaAs spin reorientation
• Fe/GaAs e-beam induced anisotropy
• Oscillatory exchange coupling
• Depth profiling magnetic multilayer domain structures
• Hot electron spin valves

John Unguris - NIST
Robert D. McMichael - NIST
Seok-Hwan Chung - University of Maryland
Daniel T. Pierce - NIST (emeritus)

W. Casey Uhlig - Army Research Laboratory
Theodore Monchesky - Dalhousie University, Canada
Michael Kelley - NIST
David Tulchinsky - Naval Research Laboratory
Andrew Gavrin - Indiana University-Purdue University at Indiana
Mark Hart - IBM, Almaden
Michael Scheinfein - Arizona State

IBM
    • David W. Abraham
Intel
    • Dimitri E. Nikonov
Advanced MicroSensors
    • Gunther Baubock
Hitachi Global
    • Jordan Katine
University of Illinois at Chicago
    • Vitali Metlushko
Katholieke Universiteit Leuven
    • Alejandro V. Silhanek
Massachusetts Institute of Technology
    • Fernando J. Castaño
    • Joy Y. Cheng
    • Vivian Chuang
    • Caroline Ross
University of California, Berkeley
    • Lane W. Martin
    • R. Ramesh
Cavendish Labratory Cambridge
    • J. A. C. Bland
University of Houston
    • J. O. Rantschler
    • D. Litinov
Geological Survey of Norway
    • Suzanne A. McEnroe
Department of Energy
    • R. Klaffky
NIST
    • Julie A. Borchers
    • Cindi Dennis
    • William F. Egelhoff
    • June W. Lau
    • Brian Maranville
    • David P. Pappas
    • Stephen E. Russek

IBM
    • S. S. P. Parkin
Hitachi Global
    • B. D. Terris
Allied Signal (Honeywell)
    • Anatol Rabinkin
Nonvolatile Electronics
    • J. Daughton
Seagate
    • M. R. Khan
    • P. J. Ryan
John Jopkins University
    • C.L. Chien
    • John Q. Xiao
Carnegie Mellon University
    • James Bain
Michigan State University
    • Jack Bass
    • William P. Pratt, Jr.
Naval Research Laboratory
    • Conrad Busman
    • Mike Miller
    • Gary Prinz
National Storage Industry Consortium
NIST
    • Joseph A. Dura
    • Charles F. Majkrzak
    • John Moreland (Boulder)

Supported in part by the Office of Naval Research

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Online: May 1996
Last Updated: February 2008

Website comments: epgwebmaster@nist.gov