Optimizing the NIST Magnetic Imaging Reference Sample
P. Rice, S. E. Russek, J. Hoinville, and M. H. Kelley
IEEE Transactions on Magnetics 33(5), 4065-4067 (1997)
Abstract:
We have further developed the NIST magnetic
imaging reference sample to include a magnetic pattern which
can indicate the magnetic polarity of a magnetic force
microscope tip. Several samples cut from the same disk were
measured with a single tip. We have also measured a single
transition with several tips. Both measurements have shown the
variability in images taken with different tips and different
instrument configuration which underscores the need for a well
calibrated sample.