In Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, May 8, 1997, 47 (1997)
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurement have shown the variability in images taken with differnt tips and different instrument configuration which underscores the need for a well calibrated sample.
Center for Nanoscale Science and Technology
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