FRIDAY
| DECEMBER 9, 2005, 2:30 PM—
Bldg 215, Rm C103–C106 | ||
![]() |
ELECTRON TRANSPORT AT THE OUTER NANOMETER Ellen Williams Director, Materials Research Science and Engineering Center, University of Maryland
| ||
MONDAY
| NOVEMBER 14, 2005, 10:30 AM—
Bldg 215, Rm C103–C106 | ||
![]() |
NANOFABRICATION AND DIRECTED SELF-ASSEMBLY Alexander Liddle Lawrence Berkeley National Laboratory, Nanofabrication Laboratory
| ||
NOVEMBER 9, 2005, 10:30 AM—
Bldg 215, Rm C103–C106 | |||
![]() |
OPTICAL TWEEZERS: PUSHING AND PULLING AROUND SMALL THINGS WITH LIGHT
Kris Helmerson NIST, Atomic Physics Division Most of us are familiar with the idea that light carries energy. What is perhaps less well known is that light also carries momentum. Over the past couple of decades, researchers have learned to harness the momentum of light to generate forces for various applications. One application is the trapping and manipulation of objects in the sub-micron and micron range. In particular, highly focused laser beams can be used to trap and manipulate objects such as microspheres, DNA, cells and sub-cellular components, which has led to the name optical tweezers for such devices. Optical tweezers are now being used worldwide in many disciplines from nanotechnology to biotechnology. This talk will describe the basic physics and strategies for implementation of optical tweezers, as well as some applications including work at NIST on single molecules in sub-micron containers and the formation of nanotubes from self-assembled membranes. | ||
FRIDAY
| OCTOBER 21, 2005, 10:30 AM—
Bldg 215, Rm C103–C106 | ||
![]() |
MANIPULATING SINGLE ATOMS AND BUILDING NANOSTRUCTURES BY DESIGN Joseph A. Stroscio NIST, Center for Nanoscale Science and Technology We are taught in grade school that matter is made up of things called atoms, a word that dates back to 400 BC, when the Greek philosophers Leucippus and Democritus postulated the smallest unit of matter is an atom. Imaging and manipulating single atoms on atomic scale dimensions were enabled with the advent of scanning tunneling microscopy (STM). In the imaging mode the STM is a non-interacting measurement probe sensitive to the electron density of states at the surface of a conductor. In the manipulation mode the STM probe tip is used to turn on an interaction with a single atom that can be manipulated with atomic scale precision. In this talk I will point out how measurements are made to study the motion of an atom in the manipulation process, the physical mechanisms involved in atom manipulation, and how one can build nanostructures by design thereby engineering a quantum laboratory. Several mechanisms can be identified in the atom dynamics during manipulation, including vibrational heating due to inelastic electron scattering and quantum tunneling processes. | ||
FRIDAY
| SEPTEMBER 30, 2005, 10:30 AM—
Bldg 101, Lecture Room A | ||
![]() |
THE NIST SMALL FORCE METROLOGY LABORATORY Jon R. Pratt NIST, Manufacturing Metrology Division
| ||
FRIDAY
| SEPTEMBER 9, 2005, 1:30 PM — Green Auditorium | ||
![]() |
THE NEW NIST AML NANOFAB
Eric Vogel NIST, Semiconductor Electronics Division The NIST AML Nanofab has been completed and will be open for operation beginning in November of 2005. The NIST AML Nanofab will provide researchers at NIST working on a variety of nano- and micro- technologies the ability to fabricate prototypical devices, test structures, measurement instruments, and reference materials down to the nanoscale. The Nanofab will be operated as a shared access user facility for all of NIST. This means that the staff of NIST and its partners, subject to provisions, training, and user fees, will be permitted to independently operate the equipment. This talk will provide an overview of the Nanofab and its operating policies. The talk will also include examples of current research within the Semiconductor Electronics Division that use Nanofabrication including molecular electronics, nanowires, and MEMS. Please come and learn what the new NIST AML Nanofab can do for you! | ||
Online: February 2007
Last Updated: June 2008
Website Comments:egpwebmaster@nist.gov